RAM Testing Algorithms for Detection Multiple Linked Faults
نویسندگان
چکیده
for testing linked faults. We prove that new algorithms have higher fault coverage than existing march tests for linked multiple faults. Many fault models for RAMs and tests for faults of these models are available. In most cases these tests allow for the detection of single faults only. This paper contains fault coverage analysis of march tests which detect multiple faults. It is shown there are faults which are not detected by any of the existing march tests. So we propose new test algorithms which cover multiple faults and particularly are effective to detect linked faults while, at the same time, having short test time. Then, we consider fault models based on physical defects analysis [3,4] and show that the new tests are effective for these faults too. 2. Concept of march tests Many types of tests for RAMs have been proposed in the past. Currently, one family of the tests, called march tests [5,6], has proven to be superior for test time and simplicity of the algorithms.
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